X-Ray Testing Equipment S-7200
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S-7200 High-Precision X-Ray Inspection Machine for Advanced PCB Testing
The S-7200 X-Ray Inspection Machine by WISDOMSHOW is designed for non-destructive inspection of electronic assemblies, semiconductor components, BGA connections, and flexible printed circuit boards (FPC). Equipped with a 90 kV Hamamatsu closed microfocus X-ray source, a 5 μm focal spot, and an iRAY flat-panel detector, it provides detailed internal images to help identify hidden defects in electronic products.
The system integrates AI-based defect analysis, automatic inspection-point navigation, and bubble measurement capabilities to support accurate and efficient quality inspection. Its 0–90° viewing angle, 150× geometric magnification, and 520 × 520 mm inspection area provide flexibility for different sample types. With built-in radiation protection, safety interlocks, and radiation leakage below 1 μSv/h, the S-7200 is designed for reliable inspection in electronics and semiconductor manufacturing.
S-7200 X-Ray Inspection Machine Technical Specifications
Detailed technical specifications of the S-7200 system for non-destructive inspection of electronic assemblies.
| Model | S-7200 |
|---|---|
| Manufacturer | WISDOMSHOW |
| Country of Origin | China |
| X-Ray Source Brand | HAMAMATSU, Japan |
| X-Ray Source Type | Closed Microfocus X-Ray Source |
| X-Ray Tube Voltage | 90 kV |
| X-Ray Tube Current | 10–200 μA |
| Focal Spot Size | 5 μm |
| Maximum X-Ray Power | 8 W |
| Detector Brand | iRAY |
| Detector Type | Amorphous Silicon Flat Panel Detector |
| Imaging Area | 130 × 130 mm |
| Photosensitive Unit Size | 85 μm |
| Pixel Matrix | 1536 × 1536 |
| Image Resolution | 5.8 Lp/mm |
| Viewing Angle | 0–90° (45° to the Left and Right) |
| Image Frame Rate | 20 fps |
| Geometric Magnification | 150× |
| Industrial Computer | Advantech Industrial Computer |
| Computer Configuration | Intel Core i5-6500, 8 GB RAM, 1 TB HDD |
| Monitor | 24-inch HD Monitor |
| Loading Area | 520 × 520 mm |
| Maximum Inspection Area | 520 × 520 mm |
| Z-Axis Travel | Detector Panel Z1: 300 mm; X-Ray Source Z2: 300 mm |
| X/Y-Axis Travel | X-Axis: 510 mm; Y-Axis: 405 mm |
| Maximum Sample Weight | 10 kg |
| Movement Control | Joystick, Mouse and Keyboard |
| Navigation Camera | Hikvision HD Camera |
| Software | Self-Developed Software with Independent Intellectual Property Rights |
| Automatic Image Setting | Records Position Coordinates and Characteristic-Point Parameters |
| Automatic Navigation | Facilitates Quick Movement to Inspection Points |
| Measurement Function | Bubble Measurement in Electronic and Semiconductor Products |
| Algorithm Model | Customizable Detection Algorithms |
| Location Editing | Multi-Point Position Detection |
| Power Supply | 220 V / 50 Hz |
| Maximum Power Consumption | 2.0 kW |
| Machine Dimensions | 1300 × 1320 × 1800 mm (L × W × H) |
| Machine Weight | Approximately 1250 kg |
| Radiation Leakage | Less than 1 μSv/h |
| Radiation Protection | Steel-Lead-Steel Housing, Leaded Glass Front Door and Door Safety Interlocks |
Advanced Features of the S-7200 X-Ray Inspection Machine
High-resolution X-ray imaging, intelligent inspection software and safety features for electronic and semiconductor testing.
Microfocus X-Ray Source
The 90 kV Hamamatsu closed microfocus X-ray source features a 5 μm focal spot for internal inspection.
Flat Panel Detector
The iRAY amorphous silicon detector features a 130 × 130 mm imaging area and a 1536 × 1536 pixel matrix.
150× Geometric Magnification
Geometric magnification supports detailed viewing of internal structures and potential defects.
Adjustable Viewing Angle
The 0–90° viewing angle, with 45° movement to the left and right, provides flexible inspection views.
Precision Sample Positioning
X, Y and Z-axis movement supports accurate positioning of samples during the inspection process.
Automatic Navigation
Automatic navigation helps operators move quickly between saved inspection points.
Bubble Measurement
Built-in calculation functions measure bubbles in electronic and semiconductor products.
Customizable AI Algorithms
Customizable detection algorithm models support inspection requirements for different applications.
Multi-Point Inspection
Location editing allows operators to configure multiple inspection positions on a sample.
Industrial Computer System
An Advantech industrial computer with Intel Core i5, 8 GB RAM and 1 TB HDD supports inspection operations.
Radiation Protection
Steel-lead-steel housing, leaded glass and door safety interlocks help protect operators from radiation.
Safety Monitoring
Door interlocks automatically cut X-ray source power when a protected door is opened. Status lights indicate the operating condition of the source.
Industries we serve
Our Automated Optical Inspection (AOI) solutions support a wide range of electronics manufacturing industries by delivering intelligent defect detection, enhanced quality assurance, and reliable inspection throughout the SMT production process.